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2nd iQonic funded publication | Brunel University London

  • Posted by iqonic
  • On December 16, 2021
  • 0 Comments
  • @defect, #semiconductor, #WaferCaps, Manufacturing
On December 10th, 2021 our partner Brunel University London published its second iQonic funded publication titled “An Improved Capsule Network (WaferCaps) for Wafer Bin Map Classification Based on DCGAN Data Upsampling” on the IEEE Transactions on Semiconductor Manufacturing website in open access. Wafer bin maps contain vital information that helps semiconductor manufacturers to identify the […]
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